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(parent: 12b609b) | patch
docs: expand description for interval-based bw and iops statistics
authorVincent Fu <vincent.fu@samsung.com>
Thu, 11 May 2023 00:10:56 +0000 (20:10 -0400)
committerVincent Fu <vincent.fu@samsung.com>
Thu, 11 May 2023 00:28:49 +0000 (20:28 -0400)
commitf6f80750f75810bdaf56dd9362982055de1d7232
tree847f1742fef8cd801de63d850e82f9c95414996ctree | snapshot
parent12b609b5637b1b104578cc740d03e205b51dc4fccommit | diff
docs: expand description for interval-based bw and iops statistics

Update HOWTO.rst and fio.1 to provide more details about the descriptive
statistics interval-based bw and iops measurements.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
HOWTO.rst diff | blob | blame | history
fio.1 diff | blob | blame | history
fio - Flexible IO Tester