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(parent: 37946be) | patch
t/run-fio-test: fix comment
authorVincent Fu <vincent.fu@samsung.com>
Wed, 10 May 2023 21:29:02 +0000 (17:29 -0400)
committerVincent Fu <vincent.fu@samsung.com>
Wed, 10 May 2023 21:29:02 +0000 (17:29 -0400)
commit12b609b5637b1b104578cc740d03e205b51dc4fc
tree7a3cd2d06e157a232f1e10cdb9056b99ac6609c8tree | snapshot
parent37946bed31b688fe55e2003b6d59ff0c964165bbcommit | diff
t/run-fio-test: fix comment

The test job that measures rates is actually t0011.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
t/run-fio-tests.py diff | blob | blame | history
fio - Flexible IO Tester