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(parent: 31a58cb) | patch
test: fix hash for t0016
authorVincent Fu <vincent.fu@samsung.com>
Mon, 15 Aug 2022 15:40:58 +0000 (11:40 -0400)
committerVincent Fu <vincent.fu@samsung.com>
Tue, 16 Aug 2022 19:35:10 +0000 (15:35 -0400)
commitf045d5f85f80c226f12586df90482fe804fc5c19
treeeda310d6d0c039dc9a63734cd03fe8989c094b25tree | snapshot
parent31a58cbacdbbac5783ee0255de3532ff5294480bcommit | diff
test: fix hash for t0016

I used the wrong hash for t0016 in the original commit. Fix it to refer
to the hash that fixed the issue in this tree.

Fixes: de31fe9a ("testing: add test for slat + clat = tlat")
Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
t/jobs/t0016-259ebc00.fio [deleted file] blob | blame | history
t/jobs/t0016-d54ae22.fio [new file with mode: 0644] blob
t/run-fio-tests.py diff | blob | blame | history
fio - Flexible IO Tester