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(parent: b140fc5) | patch
docs: fix documentation for rate_cycle
authorVincent Fu <vincent.fu@samsung.com>
Mon, 18 Mar 2024 18:51:10 +0000 (14:51 -0400)
committerVincent Fu <vincent.fu@samsung.com>
Mon, 18 Mar 2024 18:51:10 +0000 (14:51 -0400)
commit7d6c99e917f7d68ffebbd1750802f7aed9c3d461
tree46fdb0376ab82f9ccc9899963636098f766874c6tree | snapshot
parentb140fc5e484638a467480e369485b91290288d58commit | diff
docs: fix documentation for rate_cycle

rate_cycle affects only rate_min and rate_iops_min.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
HOWTO.rst diff | blob | blame | history
fio.1 diff | blob | blame | history
fio - Flexible IO Tester