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(parent: a5a2429) | patch
test: add some tests for seq and rand offsets
authorVincent Fu <vincent.fu@samsung.com>
Mon, 29 Aug 2022 15:30:30 +0000 (11:30 -0400)
committerVincent Fu <vincent.fu@samsung.com>
Mon, 29 Aug 2022 20:42:18 +0000 (16:42 -0400)
commitef54f290e8d585a267bd3588ad92d1aedcb4246e
tree9d5518340f2c294d49a0ba57a8f2a3c666e604d7tree | snapshot
parenta5a2429ece9b2a7e35e2b8a0248e7b1de6d075c3commit | diff
test: add some tests for seq and rand offsets

t/jobs/t0019.fio is a seq read test
t/jobs/t0020.fio is a rand read test

We don't have any automated tests which make sure that sequential access
patterns are actually sequential and that random access patterns are not
sequential. Add these two tests to help detect the possibility that
these features could break.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
t/jobs/t0019.fio [new file with mode: 0644] blob
t/jobs/t0020.fio [new file with mode: 0644] blob
t/run-fio-tests.py diff | blob | blame | history
fio - Flexible IO Tester