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(parent: 21a2022) | patch
test: add basic tests for trimwrite workloads
authorVincent Fu <vincent.fu@samsung.com>
Wed, 5 Oct 2022 19:14:25 +0000 (12:14 -0700)
committerVincent Fu <vincent.fu@samsung.com>
Wed, 5 Oct 2022 22:15:40 +0000 (18:15 -0400)
commit2d5c460058072401b1860c3a410f6ca30d95c79c
treed42d9e291927040d48c2c7767929e1fe1598f424tree | snapshot
parent21a202292ad846d49e61ca9ffb8de1eab5eb3c06commit | diff
test: add basic tests for trimwrite workloads

We have some tests for randtrimwrite; it's easy enough to reuse the code
to test trimwrite workloads.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
t/jobs/t0024.fio [new file with mode: 0644] blob
t/run-fio-tests.py diff | blob | blame | history
fio - Flexible IO Tester