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(parent: c6cade1) | patch
test: add test for lib/pattern segfault issue
authorVincent Fu <vincent.fu@samsung.com>
Tue, 31 Jan 2023 15:43:13 +0000 (10:43 -0500)
committerVincent Fu <vincent.fu@samsung.com>
Tue, 31 Jan 2023 15:43:13 +0000 (10:43 -0500)
commit23fb164250c29d184940ddcb2c26c02ea51aea4b
treea5e316d7c05952c7ddcfceba34d7ae0c0adac318tree | snapshot
parentc6cade164bc7e35e95ba88f816be4f44475e4e23commit | diff
test: add test for lib/pattern segfault issue

Add t/jobs/t0028-c6cade16.fio to test the ability for the routines in
lib/pattern.c to parse multi-part buffer patterns.

Signed-off-by: Vincent Fu <vincent.fu@samsung.com>
t/jobs/t0028-c6cade16.fio [new file with mode: 0644] blob
t/run-fio-tests.py diff | blob | blame | history
fio - Flexible IO Tester