From: Dan Ehrenberg <dehrenberg@chromium.org>
Date: Tue, 14 Apr 2015 22:58:20 +0000 (-0700)
Subject: mtd: example job file
X-Git-Tag: fio-2.2.8~38
X-Git-Url: https://git.kernel.dk/?a=commitdiff_plain;h=b9ab9e613c0090539f519ceac6a1c237f57d4dad;p=fio.git

mtd: example job file

This job file shows how one can write sequentially to an MTD device,
erase (with trim), and do a looped write/trim workload. Ignoring EIO
errors allows operations to continue as bad blocks are skipped.
The block histogram counts P/E cycles and can be used to assess
NAND flash lifetime and failure characteristics. The job file is
written to work with the nandsim fake NAND device.

Signed-off-by: Dan Ehrenberg <dehrenberg@chromium.org>
Signed-off-by: Jens Axboe <axboe@fb.com>
---

diff --git a/examples/mtd.fio b/examples/mtd.fio
new file mode 100644
index 00000000..ca097352
--- /dev/null
+++ b/examples/mtd.fio
@@ -0,0 +1,21 @@
+[global]
+gtod_reduce=1
+filename=/dev/mtd0
+ioengine=mtd
+ignore_error=,EIO
+blocksize=512,512,16384
+skip_bad=1
+
+[write]
+stonewall
+rw=trim
+
+[write]
+stonewall
+rw=write
+
+[write]
+stonewall
+block_error_percentiles=1
+rw=writetrim
+loops=4