This job file shows how one can write sequentially to an MTD device,
erase (with trim), and do a looped write/trim workload. Ignoring EIO
errors allows operations to continue as bad blocks are skipped.
The block histogram counts P/E cycles and can be used to assess
NAND flash lifetime and failure characteristics. The job file is
written to work with the nandsim fake NAND device.
Signed-off-by: Dan Ehrenberg <dehrenberg@chromium.org>
Signed-off-by: Jens Axboe <axboe@fb.com>
--- /dev/null
+[global]
+gtod_reduce=1
+filename=/dev/mtd0
+ioengine=mtd
+ignore_error=,EIO
+blocksize=512,512,16384
+skip_bad=1
+
+[write]
+stonewall
+rw=trim
+
+[write]
+stonewall
+rw=write
+
+[write]
+stonewall
+block_error_percentiles=1
+rw=writetrim
+loops=4